DBT2-150D2
Danble
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This Environmental Test Chamber for Semiconductor Memory Chip Testing is designed for temperature test and reliability evaluation of semiconductor memeory chips under powered-on conditions.
|Key Features:
Dual Test Zones: Two independent test zones for memory chip testing.
Wide Temp Range: Supports testing from -40℃~+100℃
High-Density Sample Loading: 60 layers of sample racks in each test zone.
High Load Capacity: Supports load of 30kg per test zone
Powered-On Testing: Supports chip operation during temp testing.
High Heat Load: Designed for a heat load of 1.6kW per test zone.
Condensation-Free Testing: Designed to prevent condensation water during the testing process
| Application Scenarios
Suitable for semiconductor memory chip testing
Memory IC temperature evaluation
Powered-on semiconductor testing
Thermal reliability assessment.
| Compliance Standards
IEC 60068-2-1: Environmental testing — Tests for cold.
IEC 60068-2-2: Environmental testing — Tests for dry heat.
IEC 60068-2-14: Environmental testing — Tests for change of temperature.
IEC 61010-1: Safety requirements for electrical equipment for measurement, control, and laboratory use
| Why Choose Us?
Customized Engineering Solutions: DANBLE develops tailored environmental testing systems based on customer-specific test requirements, product dimensions, and operating conditions.
Technical Design Capability: Our engineering team works on thermal system design, temperature control, airflow optimization, and equipment configuration for demanding testing applications.
In-House Manufacturing: Integrated manufacturing and assembly processes support quality control throughout equipment production.
Application-Oriented Development: Equipment design considers actual testing conditions, including sample loading, heat dissipation, and operating requirements.
International Project Support: DANBLE provides technical coordination, equipment delivery, on-site installation, commissioning, and after-sales support for international projects.